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Characterisation of InAs/GaAs quantum dots by high resolution transmission electron microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F14%3A00432780" target="_blank" >RIV/68378271:_____/14:00432780 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterisation of InAs/GaAs quantum dots by high resolution transmission electron microscopy

  • Original language description

    The InAs/GaAs quantum dots (QDs) covered by GaAsSb strain reducing layer (SRL) have suitable properties for various applications. The GaAsSb SRL covering InAs QDs is used to improve the structure growth and the final parameters like QD density, QD size or photoluminesence. To obtain high-quality structure with required properties, the structure growth and final structure have to be deeply studied. Since the QDs and SRL system is surrounded by GaAs, the high resolution transmission electron microscopy (HRTEM) measurement was used to reveal the real material arrangement in a prepared sample. In this work we will discuss the results of following HRTEM measurements: flatness and thickness of prepared layers, QD size, atomic arrangement and composition of GaAsSb layer.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Sborník příspěvků 4. studentské vědecké konference fyziky pevných látek

  • ISBN

    978-80-01-05565-6

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    84-89

  • Publisher name

    Česká technika-nakladatelství ČVUT

  • Place of publication

    Praha

  • Event location

    Nové Hrady

  • Event date

    Jun 23, 2014

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article