Pulse measurements of small area thin film mu c-Si:H/ZnO:B photodiodes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00531981" target="_blank" >RIV/68378271:_____/20:00531981 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0310602" target="_blank" >http://hdl.handle.net/11104/0310602</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1757-899X/726/1/012011" target="_blank" >10.1088/1757-899X/726/1/012011</a>
Alternative languages
Result language
angličtina
Original language name
Pulse measurements of small area thin film mu c-Si:H/ZnO:B photodiodes
Original language description
We introduce a triggered optoelectronic system operating in a pulse mode in the near infrared and visible spectral range 0.75-3 eV. The system measures current-voltage (I-V) characteristics in dark and under visible light illumination as well as electroluminescence (EL) spectra of small area thin film photodiodes and light emitting diodes with size below 1 mm(2). The usefulness of the setup is demonstrated by measurement of optoelectronic properties of a hydrogenated microcrystalline silicon (mu c-Si:H) p-i-n diode deposited on a semi-transparent nanostructured ZnO:B electrode. No s-shaped I-V characteristics were observed under white illumination near an open circuit voltage Uoc indicating a negligible charge accumulation near mu c-Si:H/ZnO:B interface. The weak infrared EL correlates with the current density.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
IOP Conference Series: Materials Science and Engineering
ISBN
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ISSN
1757-8981
e-ISSN
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Number of pages
8
Pages from-to
1-8
Publisher name
IOP Publishing Ltd.
Place of publication
Bristol
Event location
Nova Lesna
Event date
Sep 2, 2019
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000539289000011