Amorphous/crystalline silicon interface stability: correlation between infrared spectroscopy and electronic passivation properties
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00536301" target="_blank" >RIV/68378271:_____/20:00536301 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/20:00342290
Result on the web
<a href="https://doi.org/10.1002/admi.202000957" target="_blank" >https://doi.org/10.1002/admi.202000957</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/admi.202000957" target="_blank" >10.1002/admi.202000957</a>
Alternative languages
Result language
angličtina
Original language name
Amorphous/crystalline silicon interface stability: correlation between infrared spectroscopy and electronic passivation properties
Original language description
Ultrathin layers of hydrogenated amorphous silicon (a‐Si:H), passivating the surface of crystalline silicon (c‐Si), are key enablers for high‐efficiency silicon heterojunction solar cells. In this work, the authors apply highly sensitive attenuated total reflectance Fourier‐transform infrared spectroscopy, combined with carrier‐lifetime measurements and carrier‐lifetime imaging. To gain insight, the a‐Si:H/c‐Si interfacial morphology is intentionally manipulated by applying different surface, annealing and ageing treatments. Changes are observed in the vibrational modes of hydrides (SiHX), oxides (SiHX(SiYOZ)) together with hydroxyl and hydrocarbon surface groups. The effect of unintentional oxidation and contamination is considered as well. Electronic interfacial properties are reviewed and discussed from the point of hydrogen mono‐layer passivation of the c‐Si surface and from the perspectives of a‐Si:H bulk properties.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Advanced Materials Interfaces
ISSN
2196-7350
e-ISSN
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Volume of the periodical
7
Issue of the periodical within the volume
20
Country of publishing house
DE - GERMANY
Number of pages
7
Pages from-to
1-7
UT code for WoS article
000562764400001
EID of the result in the Scopus database
2-s2.0-85089867676