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Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F07%3A03131080" target="_blank" >RIV/68407700:21230/07:03131080 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques

  • Original language description

    The optimization is an indispensable tool for extracting the parameters of any complicated models. Hence, advanced optimization techniques are also necessary for identifying the model parameters of semiconductor devices because their current models are very sophisticated (especially the BJT and MOSFET ones). The equations of such models contain typically one hundred parameters. Therefore, the measurement and particularly identification of the full set of the model parameters is very difficult. In the paper, an optimization method is presented which is applicable for the identifications of very complicated models using a relatively small number of iterations. The algorithm has been implemented into the original software tool C.I.A. (Circuit InteractiveAnalyzer) to its static and dynamic analysis modes. Therefore, the optimization is able to identify both direct-current and capacitance models of semiconductor devices. The process is demonstrated with various transistors.

  • Czech name

    Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod

  • Czech description

    Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F05%2F0277" target="_blank" >GA102/05/0277: Current- and hybrid-mode circuits for analog signal processing</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2007

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the ITI 2007 29th International Conference on Information Technology Interfaces

  • ISBN

    978-953-7138-09-7

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    603-608

  • Publisher name

    SRCE University of Zagreb

  • Place of publication

    Zagreb

  • Event location

    Cavtat

  • Event date

    Jun 25, 2007

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article