Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F07%3A03136149" target="_blank" >RIV/68407700:21230/07:03136149 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques
Original language description
The optimization is an indispensable tool for extracting the parameters of any complicated models. Hence, advanced optimization techniques are also necessary for identifying the model parameters of semiconductor devices because their current models are very sophisticated (especially the BJT and MOSFET ones). The equations of such models contain typically one hundred parameters. Therefore, the measurement and particularly identification of the full set of the model parameters is very difficult. In the paper, an optimization method is presented which is applicable for the identifications of very complicated models using a relatively small number of iterations. The algorithm has been implemented into the original software tool C.I.A. (Circuit InteractiveAnalyzer) to its static and dynamic analysis modes. Therefore, the optimization is able to identify both direct-current and capacitance models of semiconductor devices. The process is demonstrated with various transistors.
Czech name
Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod
Czech description
Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F05%2F0277" target="_blank" >GA102/05/0277: Current- and hybrid-mode circuits for analog signal processing</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Computing and Information Technology
ISSN
1330-1136
e-ISSN
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Volume of the periodical
15
Issue of the periodical within the volume
4
Country of publishing house
HR - CROATIA
Number of pages
8
Pages from-to
331-338
UT code for WoS article
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EID of the result in the Scopus database
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