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Comparison of Dynamic and Static Mechanical Stress Applied on Soldered Joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00171625" target="_blank" >RIV/68407700:21230/10:00171625 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5547292&queryText%3Dcomparison+of+dynamic+and+static%26openedRef" target="_blank" >http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5547292&queryText%3Dcomparison+of+dynamic+and+static%26openedRef</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2010.5547292" target="_blank" >10.1109/ISSE.2010.5547292</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Comparison of Dynamic and Static Mechanical Stress Applied on Soldered Joints

  • Original language description

    This article deals with the mechanical stress of lead and lead free soldered joints. During usage of electrical equipment are found structural changes of soldered joints, which can lead to cracks or failure of the solder joints. In this article, the changes of the electrical resistance of dynamic and static stressed soldered joints (lead Sn62Pb36Ag2 and lead free Sn95,5Ag4Cu0,5) are compared.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    33rd International Spring Seminar on Electronics Technology

  • ISBN

    978-1-4244-7849-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    204-207

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Warsaw

  • Event date

    May 12, 2010

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article