Comparison of commonly used fluxes aggression on copper surface
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00199223" target="_blank" >RIV/68407700:21230/12:00199223 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/ISSE.2012.6273137" target="_blank" >http://dx.doi.org/10.1109/ISSE.2012.6273137</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE.2012.6273137" target="_blank" >10.1109/ISSE.2012.6273137</a>
Alternative languages
Result language
angličtina
Original language name
Comparison of commonly used fluxes aggression on copper surface
Original language description
This article deals with observation of commonly used fluxes aggression on copper surface in electronics assembly during the reflow process. Ten types of fluxes were compared in our experiment. Measurement was carried on glass samples with copper vapor deposition. Determination of flux aggression on copper surface was based on the measurement of absorption of light on spectrophotometer.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
35th International Spring Seminar on Electronics Technology
ISBN
978-1-4673-2241-6
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
193-196
Publisher name
Technische Universität
Place of publication
Wien
Event location
Bad Aussee
Event date
May 9, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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