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ESD MOSFET model calibration by differential evolutionary optimization algorithm

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00204620" target="_blank" >RIV/68407700:21230/12:00204620 - isvavai.cz</a>

  • Result on the web

    <a href="http://147.228.94.30/index.php?option=com_content&view=article&id=356:esd-mosfet-model-calibration-by-differential-evolutionary-optimization-algorithm&catid=42:cislo-62012-eds-2012&Itemid=49" target="_blank" >http://147.228.94.30/index.php?option=com_content&view=article&id=356:esd-mosfet-model-calibration-by-differential-evolutionary-optimization-algorithm&catid=42:cislo-62012-eds-2012&Itemid=49</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    ESD MOSFET model calibration by differential evolutionary optimization algorithm

  • Original language description

    The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will bepresented.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    ElectroScope

  • ISSN

    1802-4564

  • e-ISSN

  • Volume of the periodical

    2012

  • Issue of the periodical within the volume

    6

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    7

  • Pages from-to

  • UT code for WoS article

  • EID of the result in the Scopus database