Thermal resistance investigations on new leadframe-based LED packages and boards
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F13%3A00205483" target="_blank" >RIV/68407700:21230/13:00205483 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.microrel.2013.02.016" target="_blank" >http://dx.doi.org/10.1016/j.microrel.2013.02.016</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.microrel.2013.02.016" target="_blank" >10.1016/j.microrel.2013.02.016</a>
Alternative languages
Result language
angličtina
Original language name
Thermal resistance investigations on new leadframe-based LED packages and boards
Original language description
In Solid State Lighting, thermal management is a key issue. Within the CSSL consortium, we have developed an advanced leadframe based LED package to reduce the thermal resistance of the component. Numerical simulations have been implemented using Ansys software and thermal measurements have been carried out using the forward voltage method to derive the thermal resistance. The T3ster transient thermal analysis has been used to determine the different thermal resistance contributions in the package and in the board, showing good correlation between experimental and simulation results. As a result, low thermal resistances of 5.5 K/W have been obtained on our advanced leadframe based LED package and have been compared with the standard configuration of multiple Rebel LEDs on FR4 board.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/7H10017" target="_blank" >7H10017: Consumerizing Solid State Lighting</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Reliability
ISSN
0026-2714
e-ISSN
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Volume of the periodical
8
Issue of the periodical within the volume
53
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
11
Pages from-to
1084-1094
UT code for WoS article
000322292100006
EID of the result in the Scopus database
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