Waffle MOS channel aspect ratio calculation with Schwarz-Christoffel transformation

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F13%3A00218498" target="_blank" >RIV/68407700:21230/13:00218498 - isvavai.cz</a>

Result on the web

<a href="http://147.228.94.30/images/PDF/Rocnik2013/Cislo5_2013/r7c5c12.pdf" target="_blank" >http://147.228.94.30/images/PDF/Rocnik2013/Cislo5_2013/r7c5c12.pdf</a>

DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Waffle MOS channel aspect ratio calculation with Schwarz-Christoffel transformation

Original language description

The main goal of this work is to describe alternative way of effective channel width to length (W/L) ratio calculation for Waffle MOS structure. Due to non-conventional gate geometry of the Waffle MOS transistor compare to the fingers structure, the channel W/L ratio calculation is not trivial and conformal mapping can be used. In terms of mapping the Schwarz-Christoffel (SC) Transformation is proposed. The optimal element shape of the Waffle MOS is proposed, to be easy solved by SC conformal mapping. Because result of the conformal mapping for the Waffle MOS element is rectangle shape in transformed domain, the solving of the effective channel W/L ratio of the element is become very easy because it is aspect ratio of rectangle in transformed domain.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

ElectroScope

ISSN

1802-4564

e-ISSN

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Volume of the periodical

5

Issue of the periodical within the volume

5

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

6

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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