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An evaluation of components offset and solder spreadability using factorial experiments

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00315614" target="_blank" >RIV/68407700:21230/17:00315614 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/8000955/" target="_blank" >http://ieeexplore.ieee.org/document/8000955/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2017.8000955" target="_blank" >10.1109/ISSE.2017.8000955</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    An evaluation of components offset and solder spreadability using factorial experiments

  • Original language description

    This article presents a comparison of various modifications of surfaces of components and the methods of soldering and their influences on the lead-free solders [1]. The parameters studied were the spreadability of solder and offset components. These properties depend not only on the type of solder but also on the modifying of the surface of components. To evaluate a series of samples we used 3D microscope HAWK QC 5000 NIS Elements BR. The method for analyses of factor effects was chosen the statistical method of Developing of Experiments (DOE) [2]. This work would help to facilitate the selection of suitable material combinations for achieving the highest quality solder joint

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    40th International Spring Seminar on Electronics Technology (ISSE)

  • ISBN

    978-1-5386-0582-0

  • ISSN

    2161-2536

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Sofia

  • Event date

    May 10, 2017

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000426973000078