All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Characterization of the Very Low Contact Resistance on Heavily Boron Doped (113) CVD Diamond

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F21%3A00356603" target="_blank" >RIV/68407700:21230/21:00356603 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21460/21:00356603

  • Result on the web

    <a href="https://doi.org/10.37904/nanocon.2021.4320" target="_blank" >https://doi.org/10.37904/nanocon.2021.4320</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.37904/nanocon.2021.4320" target="_blank" >10.37904/nanocon.2021.4320</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of the Very Low Contact Resistance on Heavily Boron Doped (113) CVD Diamond

  • Original language description

    The low resistance of ohmic contacts on diamond layers is important for the fabrication of diamond power electronic devices with fast switching capabilities for future high voltage applications. The low barrier height between the metal and diamond, high level of boron doping and annealing at elevated temperatures are the most critical parameters to reach the lowest contact resistivity. In this work, we report on titanium/gold ohmic contacts prepared on the heavily boron-doped (113) epitaxial diamond layers. The contact resistance has been characterized by the Circular Transmission Line Model (cTLM) structures. We used the analytical model of field enhanced emission, tunneling and the image force influence including Fermi level position dependence on the boron concentration for theoretical Ti/Au contact analysis and the Silvaco TCAD 2D simulation to estimate the measurement error associated with the nonzero metal resistance. We show that the resulting simulation values are consistent with the experimental results.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Nanocon 2021 - ABSTRACTS

  • ISBN

    978-80-88365-00-6

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    47-52

  • Publisher name

    TANGER

  • Place of publication

    Ostrava

  • Event location

    Brno

  • Event date

    Oct 20, 2021

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article