Fault Models Usability Study for On-line Tested FPGA

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00182599" target="_blank" >RIV/68407700:21240/11:00182599 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Fault Models Usability Study for On-line Tested FPGA
Original language description
FPGAs are susceptible to many environment effects that can cause soft errors (errors which can be corrected by the reconfiguration ability of the FPGA). Two different fault models are discussed and compared in this paper. The first one - Stuck-at model -is widely used in many applications and it is not limited to the FPGAs. The second one - Bit-flip model - can affect SRAM cells that are used to configure the internal routing of the FPGA and to set up the behavior of the Look-Up Tables (LUTs). The change of the LUT behavior is the only Bit-flip effect considered in this paper. A fault model analysis has been performed on small example designs in order to find the differences between the fault models. This paper discusses the relevance of using two types of models Stuck-at and Bit-flip with respect to the dependability characteristics Fault Security (FS) and Self-Testing (ST). The fault simulation using both fault models has been performed to verify the analysis
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 14th Euromicro Conference on Digital System Design
ISBN
978-0-7695-4494-6
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
287-290
Publisher name
IEEE Computer Society Press
Place of publication
Los Alamitos
Event location
Oulu
Event date
Aug 31, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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