Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F13%3A00205809" target="_blank" >RIV/68407700:21460/13:00205809 - isvavai.cz</a>
Result on the web
<a href="http://www.sciencedirect.com/science/article/pii/S0969806X13000984" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0969806X13000984</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.radphyschem.2013.02.019" target="_blank" >10.1016/j.radphyschem.2013.02.019</a>

Result language
angličtina
Original language name
Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy
Original language description
New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers.
Czech name
—
Czech description
—

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BL - Plasma physics and discharge through gases
OECD FORD branch
—

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)