Thickness Effect on Structural Defect-Related Density of States and Crystallinity in P3HT Thin Films on ITO Substrates

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F18%3A63520893" target="_blank" >RIV/70883521:28140/18:63520893 - isvavai.cz</a>

Result on the web

<a href="https://pubs.acs.org/doi/10.1021/acs.jpcc.7b11651" target="_blank" >https://pubs.acs.org/doi/10.1021/acs.jpcc.7b11651</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acs.jpcc.7b11651" target="_blank" >10.1021/acs.jpcc.7b11651</a>

Result language

angličtina

Original language name

Thickness Effect on Structural Defect-Related Density of States and Crystallinity in P3HT Thin Films on ITO Substrates

Original language description

We report on a study of thickness effect on the formation of structural defect-related density of states (DOS) in the band gap of poly(3-hexylthiophene-2,5-diyl) (P3HT) thin films spincoated on ITO substrates. The energy-resolved electrochemical impedance spectroscopy and grazing-incidence wide-angle X-ray scattering were used to correlate the DOS with the degree of crystallinity in P3HT thin films. We found an exponential increase of the defect DOS in the band gap with increasing fraction of the amorphous phase when decreasing the film thickness. The exponent increases abruptly when reducing the thickness down to 30 nm, which indicates two thickness regions with different dynamics of the defect DOS formation driven by increasing the fraction of the amorphous phase. Moreover, we observed the co-existence of two P3HT polymorphic crystalline phases with different backbone spacings, which results in the appearance of a peculiar DOS satellite peak above the highest occupied molecular orbital. The volume of the minor, more dense, crystalline phase exhibits a thickness dependence with a maximum plateau around 40 nm. These results suggest an important effect of the substrate roughness on the crystallinity and polymorphism of P3HT thin films depending on the film thickness with general implications for polymer thin films

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

20501 - Materials engineering

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

JOURNAL OF PHYSICAL CHEMISTRY C

ISSN

1932-7447

e-ISSN

1932-7447

Volume of the periodical

122

Issue of the periodical within the volume

11

Country of publishing house

US - UNITED STATES

Number of pages

7

Pages from-to

5881-5887

UT code for WoS article

000428356700006

EID of the result in the Scopus database

2-s2.0-85044464516