Focused Ion Beam in Forensic Practice

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F19%3AN0000040" target="_blank" >RIV/00007064:K01__/19:N0000040 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Focused Ion Beam in Forensic Practice

Popis výsledku v původním jazyce

Conference MC Microscopy Conference Berlin 2019, DGE Berlin Article in conference proceedings - "Focused Ion Beam in Forensic Practice" in conference proceedings, p. 948-949 abstract: Techniques of electron microscopy are widely used in the forensic field both for the initial screening and for final expert evaluation. Lately, focused ion beam have been used. Systems are significantly miniaturized and the dual SEM/FIB systems have become common laboratory devices. Usage of the Ga+ ions represents probably the most widespread FIB technique. In the forensic field, the technique allows to add and remove material ("sections" on the molecular level), imaging in the secondary ions or to carry out ion microanalysis. The toolmark examination, defectoscopy, metallography and technical diagnostic fields – visualization of deformation changes of materials, their documentation and description and possible detection of causes of deformation. Ion imaging allows good resolution of microstructural grain elements. In the forensic practice, we most often meet nanocomposites in the form of colour variable pigments – protective elements (e.g. banknotes, documents), car paints, consumer electronics, etc. and in the functional layers of glass (smart glass) – thermoglass, car glass, etc. Direct phase analysis from the surface does not provide enough information for a qualified comparison of these materials (e.g. to confirm counterfeit identification) and it is necessary to study the individual layers directly in an FIB section. Using the SEM/FIB systems techniques brings new possibilities to the forensic science field and to the exploitation of the evidentiary value of evidence which, in the past, could be examined only with difficulties or was totally unexploitable. The technique was successfully used in the whole range of real cases, e.g. examination of post blast residues, analysis of functional layers of glasses, bill of exchange counterfeits, etc., where conventional techniques could not provide the unambiguous answer

Název v anglickém jazyce

Focused Ion Beam in Forensic Practice

Popis výsledku anglicky

Conference MC Microscopy Conference Berlin 2019, DGE Berlin Article in conference proceedings - "Focused Ion Beam in Forensic Practice" in conference proceedings, p. 948-949 abstract: Techniques of electron microscopy are widely used in the forensic field both for the initial screening and for final expert evaluation. Lately, focused ion beam have been used. Systems are significantly miniaturized and the dual SEM/FIB systems have become common laboratory devices. Usage of the Ga+ ions represents probably the most widespread FIB technique. In the forensic field, the technique allows to add and remove material ("sections" on the molecular level), imaging in the secondary ions or to carry out ion microanalysis. The toolmark examination, defectoscopy, metallography and technical diagnostic fields – visualization of deformation changes of materials, their documentation and description and possible detection of causes of deformation. Ion imaging allows good resolution of microstructural grain elements. In the forensic practice, we most often meet nanocomposites in the form of colour variable pigments – protective elements (e.g. banknotes, documents), car paints, consumer electronics, etc. and in the functional layers of glass (smart glass) – thermoglass, car glass, etc. Direct phase analysis from the surface does not provide enough information for a qualified comparison of these materials (e.g. to confirm counterfeit identification) and it is necessary to study the individual layers directly in an FIB section. Using the SEM/FIB systems techniques brings new possibilities to the forensic science field and to the exploitation of the evidentiary value of evidence which, in the past, could be examined only with difficulties or was totally unexploitable. The technique was successfully used in the whole range of real cases, e.g. examination of post blast residues, analysis of functional layers of glasses, bill of exchange counterfeits, etc., where conventional techniques could not provide the unambiguous answer

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

50902 - Social sciences, interdisciplinary

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů