Capability of Electron Microscopy in Forensic Science

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F19%3AN0000002" target="_blank" >RIV/00007064:K01__/19:N0000002 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1017/S143192761800644X" target="_blank" >http://dx.doi.org/10.1017/S143192761800644X</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S143192761800644X" target="_blank" >10.1017/S143192761800644X</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Capability of Electron Microscopy in Forensic Science

Popis výsledku v původním jazyce

The possibilities of electron microscopy have been recently greatly enhanced by the use of dual systems with a focused ion beam. Probably the most widely used FIB technique in forensic science is the use of Ga+ ions. These techniques allow the addition and removal of materials (molecular level), imaging in secondary ions and, optionally, performing ion microanalysis. For the time being, SEM/FIB technology has found applications in the following areas of forensic practice: Analysis of superposition of toner/writing ink, Thermogenetic particles, Nanocomposites and nanoparticles, Deformations in alloys, etc. The use of modern SEM techniques brings to forensic science new possibilities and use of evidence from traces that have been difficult to process or unusable in the past. Techniques are successfully used in a number of real cases where conventional techniques have been unable to provide a clear answer to investigators' questions

Název v anglickém jazyce

Capability of Electron Microscopy in Forensic Science

Popis výsledku anglicky

The possibilities of electron microscopy have been recently greatly enhanced by the use of dual systems with a focused ion beam. Probably the most widely used FIB technique in forensic science is the use of Ga+ ions. These techniques allow the addition and removal of materials (molecular level), imaging in secondary ions and, optionally, performing ion microanalysis. For the time being, SEM/FIB technology has found applications in the following areas of forensic practice: Analysis of superposition of toner/writing ink, Thermogenetic particles, Nanocomposites and nanoparticles, Deformations in alloys, etc. The use of modern SEM techniques brings to forensic science new possibilities and use of evidence from traces that have been difficult to process or unusable in the past. Techniques are successfully used in a number of real cases where conventional techniques have been unable to provide a clear answer to investigators' questions

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

50902 - Social sciences, interdisciplinary

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Microscopy and Microanalysis

ISBN

—

ISSN

1431-9276

e-ISSN

—

Počet stran výsledku

2

Strana od-do

1192-1193

Název nakladatele

Cambridge University Press

Místo vydání

GB

Místo konání akce

Baltimore

Datum konání akce

1. 1. 2018

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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