Methods for topography artifacts compensation in scanning thermal microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F15%3A%230001223" target="_blank" >RIV/00177016:_____/15:#0001223 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26110/15:PU114171

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2015.04.011</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ultramic.2015.04.011" target="_blank" >10.1016/j.ultramic.2015.04.011</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Methods for topography artifacts compensation in scanning thermal microscopy

Popis výsledku v původním jazyce

Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. This is pronounced on samples with sharp topographic features, on rough samples and while using larger probes,for example, Wollaston wire-based probes. The topography artifacts can be so high that they can even obscure local thermal conductivity variations influencing the measured signal. Three methods for numerically estimating and compensating for topographicartifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe-sample interaction. A local topography and an estimated probe shapeare used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measure

Název v anglickém jazyce

Methods for topography artifacts compensation in scanning thermal microscopy

Popis výsledku anglicky

Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. This is pronounced on samples with sharp topographic features, on rough samples and while using larger probes,for example, Wollaston wire-based probes. The topography artifacts can be so high that they can even obscure local thermal conductivity variations influencing the measured signal. Three methods for numerically estimating and compensating for topographicartifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe-sample interaction. A local topography and an estimated probe shapeare used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measure

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

—

Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ULTRAMICROSCOPY

ISSN

0304-3991

e-ISSN

—

Svazek periodika

155

Číslo periodika v rámci svazku

srpen

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

55-61

Kód UT WoS článku

000355211900007

EID výsledku v databázi Scopus

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