Development of measurement and extraction technique of complex permittivity using transmission parameter S_21 for millimeter-wave frequencies

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F17%3AN0000024" target="_blank" >RIV/00177016:_____/17:N0000024 - isvavai.cz</a>

Výsledek na webu

<a href="https://link.springer.com/article/10.1007/s10762-017-0421-y" target="_blank" >https://link.springer.com/article/10.1007/s10762-017-0421-y</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s10762-017-0421-y" target="_blank" >10.1007/s10762-017-0421-y</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Development of measurement and extraction technique of complex permittivity using transmission parameter S_21 for millimeter-wave frequencies

Popis výsledku v původním jazyce

This study provides an overview of measured S-parameters and its processing to extract the dielectric properties of materials such as Teflon, PMMA, and PVC which are preferred for materials characterization process. In addition, a correction model is presented for transmission parameter (S 21) to obtain the dielectric constant with high accuracy. A non-destructive and non-contact free space measurement method has been used to measure S-parameters of thin samples in the low THz frequency range. S-parameters are measured in free space by vector network analyzer supported with two frequency extenders. Additionally, the parabolic mirrors are used to collimate the generated beam in wide frequency range. Furthermore, a standard filter process is performed to remove the undesired ripples in signal using singular spectrum analyzer before the implementation of extraction process. Newton-Raphson extraction technique is used to extract the material complex permittivity as a function of the frequency in Y-band (325–500 GHz).

Název v anglickém jazyce

Development of measurement and extraction technique of complex permittivity using transmission parameter S_21 for millimeter-wave frequencies

Popis výsledku anglicky

This study provides an overview of measured S-parameters and its processing to extract the dielectric properties of materials such as Teflon, PMMA, and PVC which are preferred for materials characterization process. In addition, a correction model is presented for transmission parameter (S 21) to obtain the dielectric constant with high accuracy. A non-destructive and non-contact free space measurement method has been used to measure S-parameters of thin samples in the low THz frequency range. S-parameters are measured in free space by vector network analyzer supported with two frequency extenders. Additionally, the parabolic mirrors are used to collimate the generated beam in wide frequency range. Furthermore, a standard filter process is performed to remove the undesired ripples in signal using singular spectrum analyzer before the implementation of extraction process. Newton-Raphson extraction technique is used to extract the material complex permittivity as a function of the frequency in Y-band (325–500 GHz).

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/7AX13009" target="_blank" >7AX13009: Microwave and terahertz metrology for homeland security</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Infrared, Millimeter, and Terahertz Waves

ISSN

1866-6892

e-ISSN

1866-6906

Svazek periodika

38

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

21

Strana od-do

1510-1520

Kód UT WoS článku

000412934400009

EID výsledku v databázi Scopus

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