Synthetic Data in Quantitative Scanning Probe Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F21%3AN0000016" target="_blank" >RIV/00177016:_____/21:N0000016 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26620/21:PU142112

Výsledek na webu

<a href="https://www.mdpi.com/2079-4991/11/7/1746" target="_blank" >https://www.mdpi.com/2079-4991/11/7/1746</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/nano11071746" target="_blank" >10.3390/nano11071746</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Synthetic Data in Quantitative Scanning Probe Microscopy

Popis výsledku v původním jazyce

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

Název v anglickém jazyce

Synthetic Data in Quantitative Scanning Probe Microscopy

Popis výsledku anglicky

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21100 - Other engineering and technologies

Projekt

<a href="/cs/project/8B20002" target="_blank" >8B20002: High throughput metrology for nanowire energy harvesting devices</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nanomaterials

ISSN

2079-4991

e-ISSN

—

Svazek periodika

11

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

26

Strana od-do

—

Kód UT WoS článku

000676561700001

EID výsledku v databázi Scopus

2-s2.0-85118093327