Setting probing force and scanning speed of fast microprobes for non-destructive roughness and microform measurements
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F21%3AN0000090" target="_blank" >RIV/00177016:_____/21:N0000090 - isvavai.cz</a>
Výsledek na webu
<a href="https://www.ptb.de/empir2018/fileadmin/documents/empir/MicroProbes/Good_Practice_Guide_No_2_MicroProbes_Force_Speed.pdf" target="_blank" >https://www.ptb.de/empir2018/fileadmin/documents/empir/MicroProbes/Good_Practice_Guide_No_2_MicroProbes_Force_Speed.pdf</a>
DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Setting probing force and scanning speed of fast microprobes for non-destructive roughness and microform measurements
Popis výsledku v původním jazyce
This Good Practice Guide (GPG) was developed during the course of the EMPIR project MicroProbes “Multifunctional ultrafast microprobes for on ‐ the ‐ machine measurements”. Within this project fast piezoresistive silicon microprobes were developed for fast roughness measurements and mechanical property measurements. During fast tactile topography measurements, the inertia of the microprobe cantilever creates dynamic forces which might lead to tip flight and thus measurement errors. To prevent from tip flight, usually the highest possible probing forces are used. These are mainly given by the hardness of the surface to be measured. The Good Practice Guide helps users of microprobes to set the probing force and the maximum scanning speed of their microprobing system for reliable topography and roughness measurements.
Název v anglickém jazyce
Setting probing force and scanning speed of fast microprobes for non-destructive roughness and microform measurements
Popis výsledku anglicky
This Good Practice Guide (GPG) was developed during the course of the EMPIR project MicroProbes “Multifunctional ultrafast microprobes for on ‐ the ‐ machine measurements”. Within this project fast piezoresistive silicon microprobes were developed for fast roughness measurements and mechanical property measurements. During fast tactile topography measurements, the inertia of the microprobe cantilever creates dynamic forces which might lead to tip flight and thus measurement errors. To prevent from tip flight, usually the highest possible probing forces are used. These are mainly given by the hardness of the surface to be measured. The Good Practice Guide helps users of microprobes to set the probing force and the maximum scanning speed of their microprobing system for reliable topography and roughness measurements.
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
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OECD FORD obor
21100 - Other engineering and technologies
Návaznosti výsledku
Projekt
<a href="/cs/project/8B18006" target="_blank" >8B18006: Multifunctional ultrafast microprobes for on-the-machine measurements</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2021
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů