Wide spectral range optical characterization of tantalum pentoxide (Ta2O5) films by the universal dispersion model
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F25%3AN0000121" target="_blank" >RIV/00177016:_____/25:N0000121 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/00216224:14310/25:00141079
Výsledek na webu
<a href="https://opg.optica.org/ome/fulltext.cfm?uri=ome-15-4-903" target="_blank" >https://opg.optica.org/ome/fulltext.cfm?uri=ome-15-4-903</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OME.550708" target="_blank" >10.1364/OME.550708</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Wide spectral range optical characterization of tantalum pentoxide (Ta2O5) films by the universal dispersion model
Popis výsledku v původním jazyce
This study presents a comprehensive optical characterization of tantalum pentoxide (Ta2O5) thin films across a wide spectral range, using a combination of ellipsometric and spectrophotometric data. The films prepared using e-beam evaporation, ranging in thickness from 20 to 250 nm, were analyzed using a complex structural model that integrates inhomogeneous layer profiles with three distinct phases, allowing for a more accurate representation of the material's optical properties. A universal dispersion model was employed to describe the optical constants, revealing the refractive index and extinction coefficient with exceptional precision. This work stands out due to the extensive spectral range covered-extending from the far infrared (400 mu m, 25 cm-1) to the vacuum ultraviolet (116 nm, 10.7 eV)-and the diverse array of instruments used, providing a level of detail and insight into Ta2O5's optical behavior that has not been achieved before. This novel approach offers significant advancements in understanding Ta2O5's optical characteristics, demonstrating its potential for advanced optical coatings and optoelectronic applications.
Název v anglickém jazyce
Wide spectral range optical characterization of tantalum pentoxide (Ta2O5) films by the universal dispersion model
Popis výsledku anglicky
This study presents a comprehensive optical characterization of tantalum pentoxide (Ta2O5) thin films across a wide spectral range, using a combination of ellipsometric and spectrophotometric data. The films prepared using e-beam evaporation, ranging in thickness from 20 to 250 nm, were analyzed using a complex structural model that integrates inhomogeneous layer profiles with three distinct phases, allowing for a more accurate representation of the material's optical properties. A universal dispersion model was employed to describe the optical constants, revealing the refractive index and extinction coefficient with exceptional precision. This work stands out due to the extensive spectral range covered-extending from the far infrared (400 mu m, 25 cm-1) to the vacuum ultraviolet (116 nm, 10.7 eV)-and the diverse array of instruments used, providing a level of detail and insight into Ta2O5's optical behavior that has not been achieved before. This novel approach offers significant advancements in understanding Ta2O5's optical characteristics, demonstrating its potential for advanced optical coatings and optoelectronic applications.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Návaznosti výsledku
Projekt
<a href="/cs/project/EI22_002%2F0000677" target="_blank" >EI22_002/0000677: Pokročilá optika pro aplikace ultrakrátkých laserových pulzů ve vlnové oblasti DUV, VIS a NIR</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Optical Materials Express
ISSN
2159-3930
e-ISSN
—
Svazek periodika
15
Číslo periodika v rámci svazku
4
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
17
Strana od-do
903-919
Kód UT WoS článku
001459720200003
EID výsledku v databázi Scopus
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