Multi-Scale Analysis of Hydrogen-Induced Buckling in Pd Films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206840" target="_blank" >RIV/00216208:11320/09:00206840 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Multi-Scale Analysis of Hydrogen-Induced Buckling in Pd Films

Popis výsledku v původním jazyce

Hydrogen loading causes a significant volume expansion, which is isotropic in free-standing bulk materials. Contrary to bulk samples, thin films are clamped to an elastically stiff substrate, which prevents in-plane expansion. Hence, volume expansion ofa thin film is strongly anisotropic because it expands only in the out-of-plane direction. High internal stresses introduced during hydrogen loading may lead to a situation when detachment of film from the substrate is energetically favorable. In the present work, we studied hydrogen-induced buckling of thin Pd films using a multi-scale approach. Defects in buckled films were characterized on the atomic level by positron annihilation spectroscopy combined with microstructure studies by transmission electron microscopy. Meso-scale measurements were performed by acoustics emission. Observations at the macroscopic level were performed by optical microscopy.

Název v anglickém jazyce

Multi-Scale Analysis of Hydrogen-Induced Buckling in Pd Films

Popis výsledku anglicky

Hydrogen loading causes a significant volume expansion, which is isotropic in free-standing bulk materials. Contrary to bulk samples, thin films are clamped to an elastically stiff substrate, which prevents in-plane expansion. Hence, volume expansion ofa thin film is strongly anisotropic because it expands only in the out-of-plane direction. High internal stresses introduced during hydrogen loading may lead to a situation when detachment of film from the substrate is energetically favorable. In the present work, we studied hydrogen-induced buckling of thin Pd films using a multi-scale approach. Defects in buckled films were characterized on the atomic level by positron annihilation spectroscopy combined with microstructure studies by transmission electron microscopy. Meso-scale measurements were performed by acoustics emission. Observations at the macroscopic level were performed by optical microscopy.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Procedia Engineering

ISSN

1877-7058

e-ISSN

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Svazek periodika

1

Číslo periodika v rámci svazku

neuveden

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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