Microstructure of Equal-Channel Angular Pressed Cu and Cu-Zr Samples Studied by Different Methods

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F10%3A10057489" target="_blank" >RIV/00216208:11320/10:10057489 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Microstructure of Equal-Channel Angular Pressed Cu and Cu-Zr Samples Studied by Different Methods

Popis výsledku v původním jazyce

Polycrystalline samples of technical-purity Cu (99.95 wt pct) and Cu with 0.18 % wt pct Zr have been processed at room temperature by equal-channel angular pressing (ECAP). The microstructure evolution and its fragmentation after ECAP were investigated by transmission electron microscopy (TEM), electron backscattered diffraction (EBSD), positron annihilation spectroscopy (PAS), and by X-ray diffraction (XRD) line-profile analysis. The first two techniques revealed an increase in the fraction of high-angle grain boundaries (HAGBs), with increasing strain reaching the value of 90 pct after eight ECAP passes. The increase was more pronounced for pure Cu samples. The following two kinds of defects were identified in ECAP specimens by PAS: (1) dislocationsthat represent the dominant kind of defects and (2) small vacancy clusters (so-called microvoids). A detailed XRD line-profile analysis was performed by the analysis of individual peaks and by total profile fitting.

Název v anglickém jazyce

Microstructure of Equal-Channel Angular Pressed Cu and Cu-Zr Samples Studied by Different Methods

Popis výsledku anglicky

Polycrystalline samples of technical-purity Cu (99.95 wt pct) and Cu with 0.18 % wt pct Zr have been processed at room temperature by equal-channel angular pressing (ECAP). The microstructure evolution and its fragmentation after ECAP were investigated by transmission electron microscopy (TEM), electron backscattered diffraction (EBSD), positron annihilation spectroscopy (PAS), and by X-ray diffraction (XRD) line-profile analysis. The first two techniques revealed an increase in the fraction of high-angle grain boundaries (HAGBs), with increasing strain reaching the value of 90 pct after eight ECAP passes. The increase was more pronounced for pure Cu samples. The following two kinds of defects were identified in ECAP specimens by PAS: (1) dislocationsthat represent the dominant kind of defects and (2) small vacancy clusters (so-called microvoids). A detailed XRD line-profile analysis was performed by the analysis of individual peaks and by total profile fitting.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

ISSN

1073-5623

e-ISSN

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Svazek periodika

41A

Číslo periodika v rámci svazku

5

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

17

Strana od-do

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Kód UT WoS článku

000275974800016

EID výsledku v databázi Scopus

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