In-Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10139990" target="_blank" >RIV/00216208:11320/13:10139990 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279" target="_blank" >http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279" target="_blank" >10.4028/www.scientific.net/MSF.753.279</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
In-Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP
Popis výsledku v původním jazyce
X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressed) Cu and Cu-Zr were performed after annealing and by in-situ measurements in XRD high-temperature chamber. Significant dependence of thermal stability of fine ECAP microstructure on number of passes was found. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care mustbe given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffractio
Název v anglickém jazyce
In-Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP
Popis výsledku anglicky
X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressed) Cu and Cu-Zr were performed after annealing and by in-situ measurements in XRD high-temperature chamber. Significant dependence of thermal stability of fine ECAP microstructure on number of passes was found. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care mustbe given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffractio
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
BM - Fyzika pevných látek a magnetismus
OECD FORD obor
—
Návaznosti výsledku
Projekt
<a href="/cs/project/GAP108%2F11%2F1539" target="_blank" >GAP108/11/1539: Nanokrystalické materiály - rtg charakterizace struktury a její teplotní stability</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2013
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
Materials Science Forum
ISBN
—
ISSN
0255-5476
e-ISSN
—
Počet stran výsledku
6
Strana od-do
279-284
Název nakladatele
TRANS TECH PUBLICATIONS LTD
Místo vydání
STAFA-ZURICH
Místo konání akce
Sydney
Datum konání akce
5. 5. 2013
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000320677500059