X-Ray Diffraction Analysis of Residual Stress in Thin Polycrystalline Anatase Films and Elastic Anisotropy of Anatase

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10103773" target="_blank" >RIV/00216208:11320/11:10103773 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.springerlink.com/content/1434810n77825lj4/fulltext.html" target="_blank" >http://www.springerlink.com/content/1434810n77825lj4/fulltext.html</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s11661-010-0468-z" target="_blank" >10.1007/s11661-010-0468-z</a>

Jazyk výsledku

angličtina

Název v původním jazyce

X-Ray Diffraction Analysis of Residual Stress in Thin Polycrystalline Anatase Films and Elastic Anisotropy of Anatase

Popis výsledku v původním jazyce

The importance of residual stress in anatase thin films for their photo-induced hydrophilicity was proved recently. Detailed X-ray diffraction (XRD) studies of residual stresses in titanium dioxide films are presented here. Measurements including multiple hkl reflections on several series of these films revealed the presence of tensile stresses in the films that were obtained by crystallization from amorphous state. Significant anisotropy of the strain was also found and compared with that of anatase, resulting from its theoretically calculated single-crystal elastic constants. The XRD data support the experimental evidence of the hypothesis that the [00l] axis is the elastically soft anatase direction, whereas the directions in the [h00] x [hk0] planeare elastically stiff. This is in agreement with the anisotropy predicted by single-crystal elastic constants that are obtained from ab-initio calculations. Residual stress analysis for materials with tetragonal symmetry is described and

Název v anglickém jazyce

X-Ray Diffraction Analysis of Residual Stress in Thin Polycrystalline Anatase Films and Elastic Anisotropy of Anatase

Popis výsledku anglicky

The importance of residual stress in anatase thin films for their photo-induced hydrophilicity was proved recently. Detailed X-ray diffraction (XRD) studies of residual stresses in titanium dioxide films are presented here. Measurements including multiple hkl reflections on several series of these films revealed the presence of tensile stresses in the films that were obtained by crystallization from amorphous state. Significant anisotropy of the strain was also found and compared with that of anatase, resulting from its theoretically calculated single-crystal elastic constants. The XRD data support the experimental evidence of the hypothesis that the [00l] axis is the elastically soft anatase direction, whereas the directions in the [h00] x [hk0] planeare elastically stiff. This is in agreement with the anisotropy predicted by single-crystal elastic constants that are obtained from ab-initio calculations. Residual stress analysis for materials with tetragonal symmetry is described and

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

ISSN

1073-5623

e-ISSN

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Svazek periodika

42A

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

3323-3332

Kód UT WoS článku

000295038900013

EID výsledku v databázi Scopus

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