Intrinsic resolutions of DEPFET detector prototypes measured at beam tests

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10106639" target="_blank" >RIV/00216208:11320/11:10106639 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.nima.2011.02.015" target="_blank" >http://dx.doi.org/10.1016/j.nima.2011.02.015</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nima.2011.02.015" target="_blank" >10.1016/j.nima.2011.02.015</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Intrinsic resolutions of DEPFET detector prototypes measured at beam tests

Popis výsledku v původním jazyce

The paper is based on the data of the 2009 DEPFET beam test at CERN SPS. The beam test used beams of pions and electrons with energies between 40 and 120 GeV, and the sensors tested were prototypes with thickness of 450 mu m and pixel pitch between 20 and 32 mu m. Intrinsic resolutions of the detectors are calculated by disentangling the contributions of measurement errors and multiple scattering in tracking residuals. Properties of the intrinsic resolution estimates and factors that influence them arediscussed. For the DEPFET detectors in the beam test, the calculation yields intrinsic resolutions of approximate to 1 mu m, with a typical accuracy of 0.1 mu m. Bias scan, angle scan, and energy scan are used as example studies to show that the intrinsic resolutions are a useful tool in studies of detector properties. With sufficiently precise telescopes, detailed resolution maps can be constructed and used to study and optimize detector performance.

Název v anglickém jazyce

Intrinsic resolutions of DEPFET detector prototypes measured at beam tests

Popis výsledku anglicky

The paper is based on the data of the 2009 DEPFET beam test at CERN SPS. The beam test used beams of pions and electrons with energies between 40 and 120 GeV, and the sensors tested were prototypes with thickness of 450 mu m and pixel pitch between 20 and 32 mu m. Intrinsic resolutions of the detectors are calculated by disentangling the contributions of measurement errors and multiple scattering in tracking residuals. Properties of the intrinsic resolution estimates and factors that influence them arediscussed. For the DEPFET detectors in the beam test, the calculation yields intrinsic resolutions of approximate to 1 mu m, with a typical accuracy of 0.1 mu m. Bias scan, angle scan, and energy scan are used as example studies to show that the intrinsic resolutions are a useful tool in studies of detector properties. With sufficiently precise telescopes, detailed resolution maps can be constructed and used to study and optimize detector performance.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BF - Elementární částice a fyzika vysokých energií

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ISSN

0168-9002

e-ISSN

—

Svazek periodika

638

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

9

Strana od-do

24-32

Kód UT WoS článku

000290082600005

EID výsledku v databázi Scopus

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