Slow-Polishing Iodine-Based Etchant for CdTe and CdZnTe Single Crystals

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10127045" target="_blank" >RIV/00216208:11320/12:10127045 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1007/s11664-012-2001-1" target="_blank" >http://dx.doi.org/10.1007/s11664-012-2001-1</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s11664-012-2001-1" target="_blank" >10.1007/s11664-012-2001-1</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Slow-Polishing Iodine-Based Etchant for CdTe and CdZnTe Single Crystals

Popis výsledku v původním jazyce

We report on new etching solutions for treatment of CdTe and CdZnTe surfaces based on the iodine-emerging etchant composition KIO3-KI-citric acid (C6H8O7). CdTe samples with (111), (110), and (100) orientations, and also Cd1-x Zn (x) Te (x = 0.04, 0.1) samples with (111), (110), (100), and (211) orientations were investigated. The dissolution rate was determined as a function of solution composition, etchant storage time, disc rotation speed, and temperature. It was established that this chemical dissolution is diffusion controlled. Study of the chemical composition and structure of (211)B Cd1-x Zn (x) Te surfaces etched under different conditions was carried out. x-Ray photoelectron spectroscopy measurements showed that a stoichiometric surface was achieved after briefly heating the etched surface in a vacuum. Reflection high-energy electron diffraction measurements revealed a high-quality single-crystalline surface layer in samples etched with KIO3-KI-citric acid solutions as compare

Název v anglickém jazyce

Slow-Polishing Iodine-Based Etchant for CdTe and CdZnTe Single Crystals

Popis výsledku anglicky

We report on new etching solutions for treatment of CdTe and CdZnTe surfaces based on the iodine-emerging etchant composition KIO3-KI-citric acid (C6H8O7). CdTe samples with (111), (110), and (100) orientations, and also Cd1-x Zn (x) Te (x = 0.04, 0.1) samples with (111), (110), (100), and (211) orientations were investigated. The dissolution rate was determined as a function of solution composition, etchant storage time, disc rotation speed, and temperature. It was established that this chemical dissolution is diffusion controlled. Study of the chemical composition and structure of (211)B Cd1-x Zn (x) Te surfaces etched under different conditions was carried out. x-Ray photoelectron spectroscopy measurements showed that a stoichiometric surface was achieved after briefly heating the etched surface in a vacuum. Reflection high-energy electron diffraction measurements revealed a high-quality single-crystalline surface layer in samples etched with KIO3-KI-citric acid solutions as compare

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/GAP102%2F10%2F0148" target="_blank" >GAP102/10/0148: Vliv inkluzí Te na účinnost radiačních detektorů CdTe a CdZnTe</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Electronic Materials

ISSN

0361-5235

e-ISSN

—

Svazek periodika

41

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

2838-2845

Kód UT WoS článku

000308655500028

EID výsledku v databázi Scopus

—