Nanostructured Pt-CeO2 thin film catalyst grown on graphite foil by magnetron sputtering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10192086" target="_blank" >RIV/00216208:11320/13:10192086 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.apsusc.2012.08.036" target="_blank" >http://dx.doi.org/10.1016/j.apsusc.2012.08.036</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2012.08.036" target="_blank" >10.1016/j.apsusc.2012.08.036</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Nanostructured Pt-CeO2 thin film catalyst grown on graphite foil by magnetron sputtering

Popis výsledku v původním jazyce

Layers of different thickness of CeO2 doped by Pt were prepared by magnetron sputtering on different substrates: Si (1 0 0) and a graphite foil. The structure and chemical composition of the Pt-CeO2 catalysts have been investigated by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and hard X-ray photoelectron spectroscopy (HAXPES). SEM showed that the layers prepared on different substrates had very different morphology. XPS and HAXPES studies demonstrated that Pt was dispersed only in Pt2+ and Pt4+ oxidation states in CeO2. Intensity of Pt2+- and Pt4+-peaks was affected by the plasma substrate interaction effects showing that carbon substrate played an active role by determining the film structure. The Pt2+/Pt4+ and Ce3+/Ce4+ ratios depend on the layer thickness and increases in the case of the graphite substrate. The reduced character of porous layer was explained by a general effect of formation of defects and oxygen vacancies at oxide edges and steps, an

Název v anglickém jazyce

Nanostructured Pt-CeO2 thin film catalyst grown on graphite foil by magnetron sputtering

Popis výsledku anglicky

Layers of different thickness of CeO2 doped by Pt were prepared by magnetron sputtering on different substrates: Si (1 0 0) and a graphite foil. The structure and chemical composition of the Pt-CeO2 catalysts have been investigated by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and hard X-ray photoelectron spectroscopy (HAXPES). SEM showed that the layers prepared on different substrates had very different morphology. XPS and HAXPES studies demonstrated that Pt was dispersed only in Pt2+ and Pt4+ oxidation states in CeO2. Intensity of Pt2+- and Pt4+-peaks was affected by the plasma substrate interaction effects showing that carbon substrate played an active role by determining the film structure. The Pt2+/Pt4+ and Ce3+/Ce4+ ratios depend on the layer thickness and increases in the case of the graphite substrate. The reduced character of porous layer was explained by a general effect of formation of defects and oxygen vacancies at oxide edges and steps, an

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

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Svazek periodika

267

Číslo periodika v rámci svazku

únor

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

119-123

Kód UT WoS článku

000314881900029

EID výsledku v databázi Scopus

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