Practical chemical analysis of Pt and Pd based heterogeneous catalysts with hard X-ray photoelectron spectroscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10192091" target="_blank" >RIV/00216208:11320/13:10192091 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.elspec.2013.08.012" target="_blank" >http://dx.doi.org/10.1016/j.elspec.2013.08.012</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.elspec.2013.08.012" target="_blank" >10.1016/j.elspec.2013.08.012</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Practical chemical analysis of Pt and Pd based heterogeneous catalysts with hard X-ray photoelectron spectroscopy

Popis výsledku v původním jazyce

Interfacial properties including configuration, porosity, chemical states, and atomic diffusion greatly affect the performance of supported heterogeneous catalysts. Hard X-ray photoelectron spectroscopy (HAXPES) can be used to analyze the interfaces of heterogeneous catalysts because of its large information depth of more than 20 nm. We use HAXPES to examine Pt-doped CeO2 and related thin film catalysts evaporated on Si, carbon, and carbon nanotube substrates, because Pt-doped CeO2 has great potential as a noble metal-based heterogeneous catalyst for fuel cells. The HAXPES measurements clarify that the dopant material, substrate material, and surface pretreatment of substrate are important parameters that affect the interfacial properties of Pt-doped CeO2 and related thin film catalysts. Another advantage of HAXPES measurement of heterogeneous catalysts is that it can be used for chemical analysis of trace elements by detecting photoelectrons from deep core levels, which have large pho

Název v anglickém jazyce

Practical chemical analysis of Pt and Pd based heterogeneous catalysts with hard X-ray photoelectron spectroscopy

Popis výsledku anglicky

Interfacial properties including configuration, porosity, chemical states, and atomic diffusion greatly affect the performance of supported heterogeneous catalysts. Hard X-ray photoelectron spectroscopy (HAXPES) can be used to analyze the interfaces of heterogeneous catalysts because of its large information depth of more than 20 nm. We use HAXPES to examine Pt-doped CeO2 and related thin film catalysts evaporated on Si, carbon, and carbon nanotube substrates, because Pt-doped CeO2 has great potential as a noble metal-based heterogeneous catalyst for fuel cells. The HAXPES measurements clarify that the dopant material, substrate material, and surface pretreatment of substrate are important parameters that affect the interfacial properties of Pt-doped CeO2 and related thin film catalysts. Another advantage of HAXPES measurement of heterogeneous catalysts is that it can be used for chemical analysis of trace elements by detecting photoelectrons from deep core levels, which have large pho

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/GAP204%2F10%2F1169" target="_blank" >GAP204/10/1169: Nový katalyzátor pro vodíkový palivový článek s polymerní membránou: CNT pokryté tenkou vrstvou Pt-CeO2</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Electron Spectroscopy and Related Phenomena

ISSN

0368-2048

e-ISSN

—

Svazek periodika

190

Číslo periodika v rámci svazku

říjen, část B

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

268-277

Kód UT WoS článku

000329376900019

EID výsledku v databázi Scopus

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