Thickness threshold of structural ordering in thin MEH-PPV films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F14%3A10281079" target="_blank" >RIV/00216208:11320/14:10281079 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/70883521:28610/14:43871794

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.polymer.2014.05.054" target="_blank" >http://dx.doi.org/10.1016/j.polymer.2014.05.054</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.polymer.2014.05.054" target="_blank" >10.1016/j.polymer.2014.05.054</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Thickness threshold of structural ordering in thin MEH-PPV films

Popis výsledku v původním jazyce

The microstructure of thin poly-[2-methoxy-5-(2'-ethyl-hexyloxy)-p-phenylene vinylene] (MEH-PPV) films was investigated by photoluminescence measurements and X-Ray diffraction analysis over thickness from several tens up to several hundreds of nanometer.Obtained results were correlated with exciton diffusion length obtained by the photovoltage method. All measurements revealed that there is a threshold thickness for the microstructural order as well as for exciton diffusion length which are primary physical properties for function of any device made up from such films. Development of more ordered phase can be observed above the critical thickness of about 150 nm. Below the threshold, the polymer chains are preferentially in conformations promoting localized intrachain interactions. Above the threshold, two main features can be observed: (i) the conjugation length of polymer chain segments reaches its maximum and (ii) polymer stacking in more ordered and larger crystalline domains infl

Název v anglickém jazyce

Thickness threshold of structural ordering in thin MEH-PPV films

Popis výsledku anglicky

The microstructure of thin poly-[2-methoxy-5-(2'-ethyl-hexyloxy)-p-phenylene vinylene] (MEH-PPV) films was investigated by photoluminescence measurements and X-Ray diffraction analysis over thickness from several tens up to several hundreds of nanometer.Obtained results were correlated with exciton diffusion length obtained by the photovoltage method. All measurements revealed that there is a threshold thickness for the microstructural order as well as for exciton diffusion length which are primary physical properties for function of any device made up from such films. Development of more ordered phase can be observed above the critical thickness of about 150 nm. Below the threshold, the polymer chains are preferentially in conformations promoting localized intrachain interactions. Above the threshold, two main features can be observed: (i) the conjugation length of polymer chain segments reaches its maximum and (ii) polymer stacking in more ordered and larger crystalline domains infl

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Polymer

ISSN

0032-3861

e-ISSN

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Svazek periodika

55

Číslo periodika v rámci svazku

16

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

7

Strana od-do

4050-4056

Kód UT WoS článku

000340812300087

EID výsledku v databázi Scopus

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