Time-dependent electric field in Al/CdTe/Pt detectors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F15%3A10315438" target="_blank" >RIV/00216208:11320/15:10315438 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.nima.2015.05.057" target="_blank" >http://dx.doi.org/10.1016/j.nima.2015.05.057</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nima.2015.05.057" target="_blank" >10.1016/j.nima.2015.05.057</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Time-dependent electric field in Al/CdTe/Pt detectors

Popis výsledku v původním jazyce

Al/CdTc/PL detectors are very attractive devices for high resolution X-ray spectroscopy, even though they suffer from bias induced time instability (polarization). Polarization phenomena cause a progressive time-degradation of the spectroscopic performance of the detectors, due to hole trapping and detrapping from deep acceptor levels that directly control the electric field distribution. In this work we present experimental investigations on the electric field profile of planar Al/CdTe/Pt detectors bymeans of Pockels effect measurements. The time/temperature dependence of the electric field was investigated in a long time window (up to 10 h) and the correlation with the reverse current transients was also studied. Two energy levels (0.62 eV and 1.16eV) of the deep hole traps were measured, in agreement with our previous results obtained through electrical and spectroscopic approaches. (C) 2015 Elsevier B.V. All rights reserved.

Název v anglickém jazyce

Time-dependent electric field in Al/CdTe/Pt detectors

Popis výsledku anglicky

Al/CdTc/PL detectors are very attractive devices for high resolution X-ray spectroscopy, even though they suffer from bias induced time instability (polarization). Polarization phenomena cause a progressive time-degradation of the spectroscopic performance of the detectors, due to hole trapping and detrapping from deep acceptor levels that directly control the electric field distribution. In this work we present experimental investigations on the electric field profile of planar Al/CdTe/Pt detectors bymeans of Pockels effect measurements. The time/temperature dependence of the electric field was investigated in a long time window (up to 10 h) and the correlation with the reverse current transients was also studied. Two energy levels (0.62 eV and 1.16eV) of the deep hole traps were measured, in agreement with our previous results obtained through electrical and spectroscopic approaches. (C) 2015 Elsevier B.V. All rights reserved.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/GA13-13671S" target="_blank" >GA13-13671S: Detektory Rentgenova záření pro vysoké fotonové toky</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ISSN

0168-9002

e-ISSN

—

Svazek periodika

795

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

58-64

Kód UT WoS článku

000357894300008

EID výsledku v databázi Scopus

2-s2.0-84930960244