Sputtering of Spherical SiO2 Samples
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10334208" target="_blank" >RIV/00216208:11320/16:10334208 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1109/TPS.2016.2564502" target="_blank" >http://dx.doi.org/10.1109/TPS.2016.2564502</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TPS.2016.2564502" target="_blank" >10.1109/TPS.2016.2564502</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Sputtering of Spherical SiO2 Samples
Popis výsledku v původním jazyce
Dust grains in the interplanetary environment can be basically found in two locations floating in the free space or attached to a surface of asteroids, comets, or moons. They are sputtered by the impacts of energetic ions, and this process supplies the interplanetary space with heavy elements. The sputtering yield is generally estimated on the basis of laboratory investigations of planar samples. We use silica micrometer sized spherical grains as a prototype of a space-borne dust, bombard them by 2-keV Ar ions, and monitor the influences of simultaneous application of the electron beam as well as the electric field at the dust surface on the sputtering yield. We found that the increase in the sputtering yield due to the electron impact is much larger than expected and it can enhance the sputtering yield by a factor of 1.6 in a comparison with the sole ion bombardment. On the other hand, the influence of the electric field is not so strong (if any) and it is masked by electron impacts in our experiment. Sputtering of the grains fixed at a surface by 30-keV Ga ions revealed that the angular profile of the yield is flatter than that frequently used for a description of the sputtering process. Finally, we compare these results with the published sputtering yield values.
Název v anglickém jazyce
Sputtering of Spherical SiO2 Samples
Popis výsledku anglicky
Dust grains in the interplanetary environment can be basically found in two locations floating in the free space or attached to a surface of asteroids, comets, or moons. They are sputtered by the impacts of energetic ions, and this process supplies the interplanetary space with heavy elements. The sputtering yield is generally estimated on the basis of laboratory investigations of planar samples. We use silica micrometer sized spherical grains as a prototype of a space-borne dust, bombard them by 2-keV Ar ions, and monitor the influences of simultaneous application of the electron beam as well as the electric field at the dust surface on the sputtering yield. We found that the increase in the sputtering yield due to the electron impact is much larger than expected and it can enhance the sputtering yield by a factor of 1.6 in a comparison with the sole ion bombardment. On the other hand, the influence of the electric field is not so strong (if any) and it is masked by electron impacts in our experiment. Sputtering of the grains fixed at a surface by 30-keV Ga ions revealed that the angular profile of the yield is flatter than that frequently used for a description of the sputtering process. Finally, we compare these results with the published sputtering yield values.
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
BL - Fyzika plasmatu a výboje v plynech
OECD FORD obor
—
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2016
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
IEEE Transactions on Plasma Science
ISSN
0093-3813
e-ISSN
—
Svazek periodika
44
Číslo periodika v rámci svazku
6
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
9
Strana od-do
1036-1044
Kód UT WoS článku
000377896800021
EID výsledku v databázi Scopus
2-s2.0-84976329001