Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10371995" target="_blank" >RIV/00216208:11320/17:10371995 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.15407/fm24.04.547" target="_blank" >http://dx.doi.org/10.15407/fm24.04.547</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.15407/fm24.04.547" target="_blank" >10.15407/fm24.04.547</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers

Popis výsledku v původním jazyce

AS(20)Se(80), AS(40)Se(60) and As50Se50 films were studied by Raman spectroscopy in order to examine the local- and medium-range order of the structure. In addition, X-ray photoelectron, Raman and surface enhanced Raman spectroscopy were used to characterize the structural peculiarities at the top surface of As-Se nanolayers. Raman investigations reveal the dominance of the As2Se3 and As4Se4 molecules in the volume of the As40Se60 and As50Se50 films and significant contribution of Se in the structure of the As20Se80 film. The composition and local structure of the surfaces were determined by curve fitting of the experimental X-ray photoelectron As 3d and Se 3d core level spectra. A significant Se-enrichment was found at the near-surface layers in comparison with the composition of deeper layers which is confirmed by the dominance of As-3Se structural units in all compositions. This enrichment was also observed by surface enhanced Raman spectroscopy. Processes of arsenic oxidation and desorption of the oxidized products are impacting the structure of the surface layers of As20Se80, AS(40)Se(60) and As50Se50 films.

Název v anglickém jazyce

Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers

Popis výsledku anglicky

AS(20)Se(80), AS(40)Se(60) and As50Se50 films were studied by Raman spectroscopy in order to examine the local- and medium-range order of the structure. In addition, X-ray photoelectron, Raman and surface enhanced Raman spectroscopy were used to characterize the structural peculiarities at the top surface of As-Se nanolayers. Raman investigations reveal the dominance of the As2Se3 and As4Se4 molecules in the volume of the As40Se60 and As50Se50 films and significant contribution of Se in the structure of the As20Se80 film. The composition and local structure of the surfaces were determined by curve fitting of the experimental X-ray photoelectron As 3d and Se 3d core level spectra. A significant Se-enrichment was found at the near-surface layers in comparison with the composition of deeper layers which is confirmed by the dominance of As-3Se structural units in all compositions. This enrichment was also observed by surface enhanced Raman spectroscopy. Processes of arsenic oxidation and desorption of the oxidized products are impacting the structure of the surface layers of As20Se80, AS(40)Se(60) and As50Se50 films.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Functional Materials

ISSN

1027-5495

e-ISSN

—

Svazek periodika

24

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

UA - Ukrajina

Počet stran výsledku

8

Strana od-do

547-554

Kód UT WoS článku

000424496900007

EID výsledku v databázi Scopus

2-s2.0-85038625888