Vector MO magnetometry for mapping microwave currents

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10387930" target="_blank" >RIV/00216208:11320/18:10387930 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1063/1.5007434" target="_blank" >https://doi.org/10.1063/1.5007434</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.5007434" target="_blank" >10.1063/1.5007434</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Vector MO magnetometry for mapping microwave currents

Popis výsledku v původním jazyce

Magneto-optic (MO) effects in magnetic multilayers (MML) can be employed in non-invasive 2D mapping of microwave (mw) radiation on the surface of semiconductor chips. A typical sensor configuration consists of Fe nanolayers sandwiched with dielectrics on a thin Si substrate transparent to mw radiation. To extend the observation bandwidth, Delta f, up to 100 GHz range the sensor works at ferromagnetic resonance (FMR) frequency in applied magnetic flux density, B-appl. The mw currents excite the precession of magnetization, M, in magnetic nanolayers proportional to their amplitude. The MO component reflected on the sensor surface is proportional to the amplitude of M component, M-perpendicular to. The laser source operates at the wavelength of 410 nm. Its plane of incidence is oriented perpendicular to the M-perpendicular to plane. M-perpendicular to oscillates between polar and transverse configurations. A substantial improvement of MO figure of merit takes place in aperiodic MML. More favorable Delta f vs. B-appl dependence and MO response can potentially be achieved in MML imbedding hexagonal ferrite or Co nanolayers with in-plane magnetic anisotropy. (C) 2018 Author(s).

Název v anglickém jazyce

Vector MO magnetometry for mapping microwave currents

Popis výsledku anglicky

Magneto-optic (MO) effects in magnetic multilayers (MML) can be employed in non-invasive 2D mapping of microwave (mw) radiation on the surface of semiconductor chips. A typical sensor configuration consists of Fe nanolayers sandwiched with dielectrics on a thin Si substrate transparent to mw radiation. To extend the observation bandwidth, Delta f, up to 100 GHz range the sensor works at ferromagnetic resonance (FMR) frequency in applied magnetic flux density, B-appl. The mw currents excite the precession of magnetization, M, in magnetic nanolayers proportional to their amplitude. The MO component reflected on the sensor surface is proportional to the amplitude of M component, M-perpendicular to. The laser source operates at the wavelength of 410 nm. Its plane of incidence is oriented perpendicular to the M-perpendicular to plane. M-perpendicular to oscillates between polar and transverse configurations. A substantial improvement of MO figure of merit takes place in aperiodic MML. More favorable Delta f vs. B-appl dependence and MO response can potentially be achieved in MML imbedding hexagonal ferrite or Co nanolayers with in-plane magnetic anisotropy. (C) 2018 Author(s).

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

AIP Advances

ISSN

2158-3226

e-ISSN

—

Svazek periodika

8

Číslo periodika v rámci svazku

5

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

5

Strana od-do

—

Kód UT WoS článku

000433954000409

EID výsledku v databázi Scopus

2-s2.0-85041447394