Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F20%3A10412333" target="_blank" >RIV/00216208:11320/20:10412333 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216224:14740/20:00117383

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=n7Ubkdu1YB" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=n7Ubkdu1YB</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.pmatsci.2020.100667" target="_blank" >10.1016/j.pmatsci.2020.100667</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Popis výsledku v původním jazyce

Everybody dreams to have X-ray eyes and discover the most invisible secrets of the world around us. X-rays can probe matter (depth resolved) down to atomic resolution, if relying on diffraction-based techniques. An X-ray diffraction pattern may contain information over many length scales (atomic structure, microstructure, mesostructure). This peculiarity justifies the well-recognized impact of several X-ray diffraction-based techniques to diverse fields of research. On the other hand, X-ray spectroscopies (both in absorption and in emission) provide insights on the electronic structure and, exploiting element selectivity and local environment, can complement or even replace scattering techniques for diluted systems and amorphous materials. Herein, we provide a theoretical foundation which spans from very basic concepts, through well-known techniques, with applications to nanomaterials research. An increasing level of material complexity is explored: size and shape analysis of nanoparticles dispersed in solution or single nanostructures localized onto surfaces; local morphology/strain analysis of nanostructured surfaces; average defects analysis of stacking faulted nanocrystals; regular 2D and 3D lattices of self-assembled nanocrystals; clusters of nanocrystals without any nanoscale lattice order, standing alone as isolated objects or embedded in tenths-of-mu m-thick polymers (here coherent and focused X-rays are mandatory to explore the spatial inhomogeneity and lattice (in)coherence of the materials).

Název v anglickém jazyce

Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Popis výsledku anglicky

Everybody dreams to have X-ray eyes and discover the most invisible secrets of the world around us. X-rays can probe matter (depth resolved) down to atomic resolution, if relying on diffraction-based techniques. An X-ray diffraction pattern may contain information over many length scales (atomic structure, microstructure, mesostructure). This peculiarity justifies the well-recognized impact of several X-ray diffraction-based techniques to diverse fields of research. On the other hand, X-ray spectroscopies (both in absorption and in emission) provide insights on the electronic structure and, exploiting element selectivity and local environment, can complement or even replace scattering techniques for diluted systems and amorphous materials. Herein, we provide a theoretical foundation which spans from very basic concepts, through well-known techniques, with applications to nanomaterials research. An increasing level of material complexity is explored: size and shape analysis of nanoparticles dispersed in solution or single nanostructures localized onto surfaces; local morphology/strain analysis of nanostructured surfaces; average defects analysis of stacking faulted nanocrystals; regular 2D and 3D lattices of self-assembled nanocrystals; clusters of nanocrystals without any nanoscale lattice order, standing alone as isolated objects or embedded in tenths-of-mu m-thick polymers (here coherent and focused X-rays are mandatory to explore the spatial inhomogeneity and lattice (in)coherence of the materials).

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/GC19-10799J" target="_blank" >GC19-10799J: Studium růstové kinetiky multiferoických komplexních oxidů metodami rtg rozptylu in-situ při pulsní laserové depozici</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Progress in Materials Science

ISSN

0079-6425

e-ISSN

—

Svazek periodika

112

Číslo periodika v rámci svazku

červenec

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

70

Strana od-do

100667

Kód UT WoS článku

000536816300006

EID výsledku v databázi Scopus

2-s2.0-85082709738