Enhanced hole mobility-lifetime product in selenium-added CdTe compounds
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F23%3A10487421" target="_blank" >RIV/00216208:11320/23:10487421 - isvavai.cz</a>
Výsledek na webu
<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=QCyJshJ7AM" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=QCyJshJ7AM</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.nima.2023.168363" target="_blank" >10.1016/j.nima.2023.168363</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Enhanced hole mobility-lifetime product in selenium-added CdTe compounds
Popis výsledku v původním jazyce
An improved detector performance for 2% selenium-added CdZnTe(CZT) was observed and explained by the reduced concentration of a deep-level hole trap, which was confirmed by photoluminescence measurements of CdZnTeSe(CZTS) and CdTeSe(CTS). The hole lifetime in CZTS was found to be 2.18 µs in the selenium-containing material, which is much longer than that typically measured by 10-100 times. The prolonged lifetime of hole carriers is likely caused by the disappearance of hole trapping at a specific binding energy of 1.1-eV below the conduction band. Also, the enhanced pulse height spectra of CZTS gamma-ray detectors were explained in terms of the ratio of electron and hole mobility-lifetime products. Cu-migrated patterns are used for the first time to reveal sub-grains and their networks in CZT and CZTS. Based on qualitative analysis, the Cu-migrated patterns in CZT and CZTS showed similar results.
Název v anglickém jazyce
Enhanced hole mobility-lifetime product in selenium-added CdTe compounds
Popis výsledku anglicky
An improved detector performance for 2% selenium-added CdZnTe(CZT) was observed and explained by the reduced concentration of a deep-level hole trap, which was confirmed by photoluminescence measurements of CdZnTeSe(CZTS) and CdTeSe(CTS). The hole lifetime in CZTS was found to be 2.18 µs in the selenium-containing material, which is much longer than that typically measured by 10-100 times. The prolonged lifetime of hole carriers is likely caused by the disappearance of hole trapping at a specific binding energy of 1.1-eV below the conduction band. Also, the enhanced pulse height spectra of CZTS gamma-ray detectors were explained in terms of the ratio of electron and hole mobility-lifetime products. Cu-migrated patterns are used for the first time to reveal sub-grains and their networks in CZT and CZTS. Based on qualitative analysis, the Cu-migrated patterns in CZT and CZTS showed similar results.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2023
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
ISSN
0168-9002
e-ISSN
1872-9576
Svazek periodika
1053
Číslo periodika v rámci svazku
August 2023
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
7
Strana od-do
168363
Kód UT WoS článku
001058275900001
EID výsledku v databázi Scopus
2-s2.0-85160356170