The use of low-frequency current fluctuations in measuring the mobility of holes in the MEH-PPV polymer

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F24%3A10490928" target="_blank" >RIV/00216208:11320/24:10490928 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/70883521:28610/24:63580078

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=taCjNhhONf" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=taCjNhhONf</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.synthmet.2024.117764" target="_blank" >10.1016/j.synthmet.2024.117764</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The use of low-frequency current fluctuations in measuring the mobility of holes in the MEH-PPV polymer

Popis výsledku v původním jazyce

A diagnostic method based on the evaluation of low-frequency current fluctuation spectra is presented. When measuring the current through a p-type MEH-PPV sample, the occurrence of fluctuation is observable which can be measured with an AC amplifier. A model has been proposed that proves that the fluctuations originate from the interaction between the valence band and the band gap traps. The mean value of the amplitudes of these fluctuations increases linearly with decreasing frequency with a slope from which the product of mobility and lifetime of current carriers mu p tau p = (9 +/- 3) x 10- 15 cm2V- 1 was obtained. The hole lifetime of (0.27 +/- 0.01) ns was evaluated from the luminescence relaxation using the time-correlated single photon counting (TCSPC) technique. The mobility value (3 +/- 1) x 10-5 cm2 V- 1s- 1 calculated using the above methods was compared with the mobility 1.8 x 10-5 cm2 V- 1s- 1 determined by the CELIV method (Charge extraction by linearly increasing voltage) and good agreement was obtained.

Název v anglickém jazyce

The use of low-frequency current fluctuations in measuring the mobility of holes in the MEH-PPV polymer

Popis výsledku anglicky

A diagnostic method based on the evaluation of low-frequency current fluctuation spectra is presented. When measuring the current through a p-type MEH-PPV sample, the occurrence of fluctuation is observable which can be measured with an AC amplifier. A model has been proposed that proves that the fluctuations originate from the interaction between the valence band and the band gap traps. The mean value of the amplitudes of these fluctuations increases linearly with decreasing frequency with a slope from which the product of mobility and lifetime of current carriers mu p tau p = (9 +/- 3) x 10- 15 cm2V- 1 was obtained. The hole lifetime of (0.27 +/- 0.01) ns was evaluated from the luminescence relaxation using the time-correlated single photon counting (TCSPC) technique. The mobility value (3 +/- 1) x 10-5 cm2 V- 1s- 1 calculated using the above methods was compared with the mobility 1.8 x 10-5 cm2 V- 1s- 1 determined by the CELIV method (Charge extraction by linearly increasing voltage) and good agreement was obtained.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Synthetic Metals

ISSN

0379-6779

e-ISSN

1879-3290

Svazek periodika

309

Číslo periodika v rámci svazku

říjen

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

4

Strana od-do

117764

Kód UT WoS článku

001332675300001

EID výsledku v databázi Scopus

2-s2.0-85205535296