Optical properties of diamond-like carbon films containing SiOx

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F03%3A00008251" target="_blank" >RIV/00216224:14310/03:00008251 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Optical properties of diamond-like carbon films containing SiOx

Popis výsledku v původním jazyce

In this paper the optical properties of amorphous DLC films containing SiOx (DLC:SiOx) prepared by plasma enhanced chemical vapour deposition are studied. For this study a combined optical method based on simultaneous interpretation of experimental dataobtained within variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry is used. The interpretation of these combined experimental data is performed using a new empirical dispersion model of the optical constants characterizing the films under investigation. This dispersion model is based on parameterizing the density of the electronic states belonging to both the valence and conduction bands. It is shown that there are the strong differences between spectral dependences ofthe optical constants of the DLC films on the one hand and DLC:SiOx films on the other hand. Further, it is shown that the absorption of the DLC:SiOx films is smaller than the absorption of the pure DLC films in the visible. This is expl

Název v anglickém jazyce

Optical properties of diamond-like carbon films containing SiOx

Popis výsledku anglicky

In this paper the optical properties of amorphous DLC films containing SiOx (DLC:SiOx) prepared by plasma enhanced chemical vapour deposition are studied. For this study a combined optical method based on simultaneous interpretation of experimental dataobtained within variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry is used. The interpretation of these combined experimental data is performed using a new empirical dispersion model of the optical constants characterizing the films under investigation. This dispersion model is based on parameterizing the density of the electronic states belonging to both the valence and conduction bands. It is shown that there are the strong differences between spectral dependences ofthe optical constants of the DLC films on the one hand and DLC:SiOx films on the other hand. Further, it is shown that the absorption of the DLC:SiOx films is smaller than the absorption of the pure DLC films in the visible. This is expl

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F01%2F1110" target="_blank" >GA202/01/1110: Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2003

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Diamond and Related Materials

ISSN

0925-9635

e-ISSN

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Svazek periodika

12

Číslo periodika v rámci svazku

9

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

1532-1538

Kód UT WoS článku

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EID výsledku v databázi Scopus

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