Optické vlastnosti tekých NiO vrstev připravených pomocí pulzní laserové depoziční metody

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F05%3A00014765" target="_blank" >RIV/00216224:14310/05:00014765 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Optical properties of NiO thin films prepared by pulsed laser deposition technique

Popis výsledku v původním jazyce

In this paper the optical characterization of the NiO thin films prepared by pulsed laser deposition technique onto the quartz substrate were performed using multi-sample modification of the combined optical method based on measuring and interpreting theexperimental data obtained by variable angle spectroscopic ellipsometry and spectrophotometry in reflected and transmitted light. A new dispersion model of the optical constants of the NiO films was also used. This dispersion model was based on parameterizing of the joint density of states together with the Gaussian broadening. The defects consiting in boundary roughness and refractive index profile were taken into account in optical characterization of the NiO films too. The spectral dependences of the optical constants together with the parameters characterizing the defects of these films were determined.

Název v anglickém jazyce

Optical properties of NiO thin films prepared by pulsed laser deposition technique

Popis výsledku anglicky

In this paper the optical characterization of the NiO thin films prepared by pulsed laser deposition technique onto the quartz substrate were performed using multi-sample modification of the combined optical method based on measuring and interpreting theexperimental data obtained by variable angle spectroscopic ellipsometry and spectrophotometry in reflected and transmitted light. A new dispersion model of the optical constants of the NiO films was also used. This dispersion model was based on parameterizing of the joint density of states together with the Gaussian broadening. The defects consiting in boundary roughness and refractive index profile were taken into account in optical characterization of the NiO films too. The spectral dependences of the optical constants together with the parameters characterizing the defects of these films were determined.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

—

Svazek periodika

244

Číslo periodika v rámci svazku

1-4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

5

Strana od-do

426-430

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—