Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F11%3A00053212" target="_blank" >RIV/00216224:14310/11:00053212 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.tsf.2010.12.055" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2010.12.055</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2010.12.055" target="_blank" >10.1016/j.tsf.2010.12.055</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials

Popis výsledku v původním jazyce

Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in opticalspectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra.

Název v anglickém jazyce

Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials

Popis výsledku anglicky

Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in opticalspectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Thin Solid Films

ISSN

0040-6090

e-ISSN

—

Svazek periodika

519

Číslo periodika v rámci svazku

9

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

4

Strana od-do

2655-2658

Kód UT WoS článku

000289174200019

EID výsledku v databázi Scopus

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