Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F18%3A00104688" target="_blank" >RIV/00216224:14310/18:00104688 - isvavai.cz</a>

Výsledek na webu

<a href="https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3" target="_blank" >https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/978-3-319-75325-6_3" target="_blank" >10.1007/978-3-319-75325-6_3</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

Popis výsledku v původním jazyce

The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.

Název v anglickém jazyce

Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

Popis výsledku anglicky

The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.

Druh

C - Kapitola v odborné knize

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/LO1411" target="_blank" >LO1411: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Optical Characterization of Thin Solid Films

ISBN

9783319753249

Počet stran výsledku

52

Strana od-do

31-82

Počet stran knihy

462

Název nakladatele

Springer

Místo vydání

Cham

Kód UT WoS kapitoly

000441388800005