Verification of Nanoindentation Devices Using Atomic Force Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F20%3A00119127" target="_blank" >RIV/00216224:14310/20:00119127 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/20:N0000075

Výsledek na webu

<a href="https://doi.org/10.37904/nanocon.2019.8633" target="_blank" >https://doi.org/10.37904/nanocon.2019.8633</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.37904/nanocon.2019.8633" target="_blank" >10.37904/nanocon.2019.8633</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Verification of Nanoindentation Devices Using Atomic Force Microscopy

Popis výsledku v původním jazyce

Nanoindentation has become a popular tool for the exploration of mechanical properties of materials at the nanoscale. However, calibration and traceability issues are often neglected, making the direct comparison of results between different instruments difficult. The direct calibration of the sensors is challenging and requires dedicated instruments leaving indirect calibration as the only option to ordinary users. However, indirect calibration compares only the resulting hardness or modulus of the reference sample and the measured sample. Therefore, it cannot distinguish the source of errors, such as errors in the depth and load sensors, errors in the reference sample properties, contamination of the tip or sample, wear of tip and others.In this contribution we explore the possibility of using measurements of indents by atomic force microscopy for the verification of the depth sensor. Measurements for different nanoindentation devices are presented and compared with a focus on the uncertainties of the method.

Název v anglickém jazyce

Verification of Nanoindentation Devices Using Atomic Force Microscopy

Popis výsledku anglicky

Nanoindentation has become a popular tool for the exploration of mechanical properties of materials at the nanoscale. However, calibration and traceability issues are often neglected, making the direct comparison of results between different instruments difficult. The direct calibration of the sensors is challenging and requires dedicated instruments leaving indirect calibration as the only option to ordinary users. However, indirect calibration compares only the resulting hardness or modulus of the reference sample and the measured sample. Therefore, it cannot distinguish the source of errors, such as errors in the depth and load sensors, errors in the reference sample properties, contamination of the tip or sample, wear of tip and others.In this contribution we explore the possibility of using measurements of indents by atomic force microscopy for the verification of the depth sensor. Measurements for different nanoindentation devices are presented and compared with a focus on the uncertainties of the method.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

11th International Conference on Nanomaterials - Research & Application NANOCON 2019

ISBN

9788087294956

ISSN

2694-930X

e-ISSN

—

Počet stran výsledku

6

Strana od-do

698-703

Název nakladatele

TANGER Ltd.

Místo vydání

Ostrava

Místo konání akce

Brno

Datum konání akce

16. 10. 2019

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000664115400120