The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F22%3A00126854" target="_blank" >RIV/00216224:14310/22:00126854 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/62156489:43210/22:43921703
Výsledek na webu
<a href="https://www.sciencedirect.com/science/article/pii/S0925963522004277#" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0925963522004277#</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.diamond.2022.109245" target="_blank" >10.1016/j.diamond.2022.109245</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films
Popis výsledku v původním jazyce
Optical characterization from the FIR to the V-UV region of silicon and oxygen doped carbon films deposited on a silicon substrates is performed. In this work, the deposited films are considered as optically inhomogeneous, i.e., the optical constants depend on the depth in the films. According to the optical analysis, there is a transition layers under the deposited films with optical constants similar to amorphous silicon with hydrogen, carbon and oxygen additions. The film thicknesses obtained from optical characterization are compared with those obtained from scanning electron microscope images. From electron microscope images it is evident that the film properties are truly depth-dependent. The optical constants of the films and transition layers as functions of photon energy over the studied spectrum are determined. The static conductivity of the films is determined from measurements in FIR region. From spectral analysis in the mid-infrared region, resonance peaks were detected and the chemical composition of the film and transition layers is presented. The chemical composition is compared with the results of the EDX.
Název v anglickém jazyce
The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films
Popis výsledku anglicky
Optical characterization from the FIR to the V-UV region of silicon and oxygen doped carbon films deposited on a silicon substrates is performed. In this work, the deposited films are considered as optically inhomogeneous, i.e., the optical constants depend on the depth in the films. According to the optical analysis, there is a transition layers under the deposited films with optical constants similar to amorphous silicon with hydrogen, carbon and oxygen additions. The film thicknesses obtained from optical characterization are compared with those obtained from scanning electron microscope images. From electron microscope images it is evident that the film properties are truly depth-dependent. The optical constants of the films and transition layers as functions of photon energy over the studied spectrum are determined. The static conductivity of the films is determined from measurements in FIR region. From spectral analysis in the mid-infrared region, resonance peaks were detected and the chemical composition of the film and transition layers is presented. The chemical composition is compared with the results of the EDX.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20506 - Coating and films
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2022
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Diamond and Related Materials
ISSN
0925-9635
e-ISSN
1879-0062
Svazek periodika
128
Číslo periodika v rámci svazku
October 2022
Stát vydavatele periodika
CH - Švýcarská konfederace
Počet stran výsledku
16
Strana od-do
1-16
Kód UT WoS článku
000838984700007
EID výsledku v databázi Scopus
2-s2.0-85134880038