Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F14%3A00076244" target="_blank" >RIV/00216224:14740/14:00076244 - isvavai.cz</a>

Výsledek na webu

<a href="http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410" target="_blank" >http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1103/PhysRevB.90.045410" target="_blank" >10.1103/PhysRevB.90.045410</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering

Popis výsledku v původním jazyce

We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules.

Název v anglickém jazyce

Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering

Popis výsledku anglicky

We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/ED1.1.00%2F02.0068" target="_blank" >ED1.1.00/02.0068: CEITEC - central european institute of technology</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physical Review B

ISSN

1098-0121

e-ISSN

—

Svazek periodika

90

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

"045410-1"-"045410-6"

Kód UT WoS článku

000339094100006

EID výsledku v databázi Scopus

—