Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F14%3A00079915" target="_blank" >RIV/00216224:14740/14:00079915 - isvavai.cz</a>

Výsledek na webu

<a href="http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541" target="_blank" >http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2061353" target="_blank" >10.1117/12.2061353</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

Popis výsledku v původním jazyce

Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Gecrystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals.

Název v anglickém jazyce

Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

Popis výsledku anglicky

Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Gecrystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals.

Druh

D - Stať ve sborníku

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/ED1.1.00%2F02.0068" target="_blank" >ED1.1.00/02.0068: CEITEC - central european institute of technology</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Advances in X-Ray/EUV Optics and Components IX

ISBN

9781628412345

ISSN

0277-786X

e-ISSN

—

Počet stran výsledku

14

Strana od-do

"nestránkováno"

Název nakladatele

SPIE-INT SOC OPTICAL ENGINEERING

Místo vydání

USA

Místo konání akce

San Diego

Datum konání akce

8. 10. 2014

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000343877600030