Planární multivrstvy přípravené z chalkogenidových tenkých vrstev systémů As-Se a Ge-Se a polymerních vrstev PAI pomocí termického napařování a rotačního lití
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F08%3A00007549" target="_blank" >RIV/00216275:25310/08:00007549 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Multilayer planar structures prepared from chalcogenide thin films of As-Se and Ge-Se systems and polymer thin films using thermal evaporation and spin-coating techniques
Popis výsledku v původním jazyce
We report the preparation of multilayers based on polyamide-imide polymer and As-Se or Ge-Se chalcogenide thin films. Chalcogenide films of As-Se and Ge-Se systems were deposited using a thermal evaporation method periodically alternating with spin-coated Polyamide-imide films. Fifteen layers of PAI + As-Se system and nineteen layers of PAI + Ge-Se system were coated. Optical properties of prepared multilayers have been established using UV/vis/NIR and Ellipsometric spectroscopy. Both, PAI + As-Se and PAI + Ge-Se multilayer systems, exhibited the high-reflection bands centered around 830 nm and 1350 nm, respectively. The shift of the band position of PAI + Ge-Se multilayers to lower energies was caused by higher thickness of Ge-Se films. The bandwidthof reflection band of 8 PAI + 7 As-Se multilayer was 90 nm while bandwidth of PAI + Ge-Se system decreased to 70 nm because Ge-Se films have 0.1 lower refractive index against As-Se films. Design of 1D-photonic crystals based on alternati
Název v anglickém jazyce
Multilayer planar structures prepared from chalcogenide thin films of As-Se and Ge-Se systems and polymer thin films using thermal evaporation and spin-coating techniques
Popis výsledku anglicky
We report the preparation of multilayers based on polyamide-imide polymer and As-Se or Ge-Se chalcogenide thin films. Chalcogenide films of As-Se and Ge-Se systems were deposited using a thermal evaporation method periodically alternating with spin-coated Polyamide-imide films. Fifteen layers of PAI + As-Se system and nineteen layers of PAI + Ge-Se system were coated. Optical properties of prepared multilayers have been established using UV/vis/NIR and Ellipsometric spectroscopy. Both, PAI + As-Se and PAI + Ge-Se multilayer systems, exhibited the high-reflection bands centered around 830 nm and 1350 nm, respectively. The shift of the band position of PAI + Ge-Se multilayers to lower energies was caused by higher thickness of Ge-Se films. The bandwidthof reflection band of 8 PAI + 7 As-Se multilayer was 90 nm while bandwidth of PAI + Ge-Se system decreased to 70 nm because Ge-Se films have 0.1 lower refractive index against As-Se films. Design of 1D-photonic crystals based on alternati
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
CA - Anorganická chemie
OECD FORD obor
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Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Ostatní
Rok uplatnění
2008
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Non-Crystalline Solids
ISSN
0022-3093
e-ISSN
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Svazek periodika
354
Číslo periodika v rámci svazku
2-9
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
4
Strana od-do
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Kód UT WoS článku
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EID výsledku v databázi Scopus
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