Solid-state field-assisted silver diffusion in (TeO2)(0.6)(WO3)(0.25)(La2O3)(0.05)(Na2O)(0.1) glass

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F12%3A39895694" target="_blank" >RIV/00216275:25310/12:39895694 - isvavai.cz</a>

Výsledek na webu

<a href="http://link.springer.com/article/10.1134%2FS0020168512060180" target="_blank" >http://link.springer.com/article/10.1134%2FS0020168512060180</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1134/S0020168512060180" target="_blank" >10.1134/S0020168512060180</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Solid-state field-assisted silver diffusion in (TeO2)(0.6)(WO3)(0.25)(La2O3)(0.05)(Na2O)(0.1) glass

Popis výsledku v původním jazyce

Silver-doped layers have been produced in (TeO2)(0.6)(WO3)(0.25)(La2O3)(0.05)(Na2O)(0.1) (TWLN) glass by solid-state field-assisted diffusion. The silver concentration profile in the glass has been determined by secondary ion mass spectrometry (SIMS) andRutherford backscattering spectrometry (RBS). The Matano-Boltzmann method applied to thermally activated diffusion indicates that the silver diffusion coefficient in the glass is a weak function of silver concentration. We carried out modeling of silverconcentration profiles in the doped layer of the TWLN glass after solid-state field-assisted diffusion. Good agreement of the theoretical fit and experimental data suggests that the model chosen can be used to describe solid-state field-assisted diffusion of silver ions in TWLN glasses. Using RBS data, we have quantitatively estimated the surface density of silver atoms after field-assisted diffusion. Combining SIMS and RBS, we were able to assess the absolute silver concentration depth

Název v anglickém jazyce

Solid-state field-assisted silver diffusion in (TeO2)(0.6)(WO3)(0.25)(La2O3)(0.05)(Na2O)(0.1) glass

Popis výsledku anglicky

Silver-doped layers have been produced in (TeO2)(0.6)(WO3)(0.25)(La2O3)(0.05)(Na2O)(0.1) (TWLN) glass by solid-state field-assisted diffusion. The silver concentration profile in the glass has been determined by secondary ion mass spectrometry (SIMS) andRutherford backscattering spectrometry (RBS). The Matano-Boltzmann method applied to thermally activated diffusion indicates that the silver diffusion coefficient in the glass is a weak function of silver concentration. We carried out modeling of silverconcentration profiles in the doped layer of the TWLN glass after solid-state field-assisted diffusion. Good agreement of the theoretical fit and experimental data suggests that the model chosen can be used to describe solid-state field-assisted diffusion of silver ions in TWLN glasses. Using RBS data, we have quantitatively estimated the surface density of silver atoms after field-assisted diffusion. Combining SIMS and RBS, we were able to assess the absolute silver concentration depth

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CA - Anorganická chemie

OECD FORD obor

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Projekt

<a href="/cs/project/EE2.3.20.0254" target="_blank" >EE2.3.20.0254: Výzkumný tým pro pokročilé nekrystalické materiály</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Inorganic Materials

ISSN

0020-1685

e-ISSN

—

Svazek periodika

48

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

642-647

Kód UT WoS článku

000303864000017

EID výsledku v databázi Scopus

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