Solid state field-assisted diffusion silver diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 glass

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F12%3A00387667" target="_blank" >RIV/67985882:_____/12:00387667 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Solid state field-assisted diffusion silver diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 glass

Popis výsledku v původním jazyce

Silver_doped layers have been produced in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 (TWLN) glass by solid_state field_assisted diffusion. The silver concentration profile in the glass has been determined by secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS). The Matano?Boltzmann method applied to thermally activated diffusion indicates that the silver diffusion coefficient in the glass is a weak function of silver concentration. We carried out modeling of silver concentration profiles in the doped layer of the TWLN glass after solid_state field_assisted diffusion. Good agreement of the theoretical fit and experimental data suggests that the model chosen can be used to describe solid_state field_assisted diffusion of silver ions in TWLN glasses. Using RBS data, we have quantitatively estimated the surface density of silver atoms after field_assisted diffusion. Combining SIMS and RBS, we were able to assess the absolute silver concentration depth profile

Název v anglickém jazyce

Solid state field-assisted diffusion silver diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 glass

Popis výsledku anglicky

Silver_doped layers have been produced in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 (TWLN) glass by solid_state field_assisted diffusion. The silver concentration profile in the glass has been determined by secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS). The Matano?Boltzmann method applied to thermally activated diffusion indicates that the silver diffusion coefficient in the glass is a weak function of silver concentration. We carried out modeling of silver concentration profiles in the doped layer of the TWLN glass after solid_state field_assisted diffusion. Good agreement of the theoretical fit and experimental data suggests that the model chosen can be used to describe solid_state field_assisted diffusion of silver ions in TWLN glasses. Using RBS data, we have quantitatively estimated the surface density of silver atoms after field_assisted diffusion. Combining SIMS and RBS, we were able to assess the absolute silver concentration depth profile

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Inorganic Materials

ISSN

0020-1685

e-ISSN

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Svazek periodika

48

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

RU - Ruská federace

Počet stran výsledku

6

Strana od-do

642-647

Kód UT WoS článku

000303864000017

EID výsledku v databázi Scopus

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