Extended Study on Crystal Growth and Viscosity in Ge-Sb-Se Bulk Glasses and Thin Films
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F17%3A39911950" target="_blank" >RIV/00216275:25310/17:39911950 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1021/acs.jpcb.7b04429" target="_blank" >http://dx.doi.org/10.1021/acs.jpcb.7b04429</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1021/acs.jpcb.7b04429" target="_blank" >10.1021/acs.jpcb.7b04429</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Extended Study on Crystal Growth and Viscosity in Ge-Sb-Se Bulk Glasses and Thin Films
Popis výsledku v původním jazyce
Crystal growth rates in Ge18Sb(28)Se(54) bulk glass and thin film were measured using optical and scanning electron microscopy under isothermal conditions. The studied temperature region was 255-346 degrees C and 254-286 degrees C for bulk glass and thin film, respectively. The compact crystalline layer growing from the surface into the amorphous core was formed in bulk glasses and no bulk crystallization was observed. In the case of thin films, needle-shape crystals were formed. The crystalline layer and needle-shape crystals grew linearly with time that corresponds to a crystal growth controlled by the crystal-liquid interface kinetics. In the narrow temperature range, crystal growth rates exhibit simple exponential behavior, so the activation energies of crystal growth for the studied temperature regions were estimated (EG = 294 6 kJ/mol for bulk glass and EG = 224 +/- 12 kJ/mol for thin film). Viscosity of Ge18Sb28Se54 material was measured in the region of the undercooled melt and glass. The extrapolation of viscosity data into the immeasurable, but important, temperature range is discussed. The experimental growth data were combined with melting and viscosity data and the appropriate growth models were proposed to describe crystal growth in a wide temperature region. The standard crystal growth models are based on a simple proportionality of the crystal growth rate to the viscosity (u proportional to eta(-1)). This simple proportionality holds for the bulk material. Nevertheless, in the thin films the decoupling of the crystal growth rate from the inverse viscosity occurs, and the standard kinetic growth models need to be corrected. Such corrections provide better description of experimental data and more realistic value of the parameter describing the mean interatomic distance in the crystal-liquid interface layer, where the crystal growth takes place.
Název v anglickém jazyce
Extended Study on Crystal Growth and Viscosity in Ge-Sb-Se Bulk Glasses and Thin Films
Popis výsledku anglicky
Crystal growth rates in Ge18Sb(28)Se(54) bulk glass and thin film were measured using optical and scanning electron microscopy under isothermal conditions. The studied temperature region was 255-346 degrees C and 254-286 degrees C for bulk glass and thin film, respectively. The compact crystalline layer growing from the surface into the amorphous core was formed in bulk glasses and no bulk crystallization was observed. In the case of thin films, needle-shape crystals were formed. The crystalline layer and needle-shape crystals grew linearly with time that corresponds to a crystal growth controlled by the crystal-liquid interface kinetics. In the narrow temperature range, crystal growth rates exhibit simple exponential behavior, so the activation energies of crystal growth for the studied temperature regions were estimated (EG = 294 6 kJ/mol for bulk glass and EG = 224 +/- 12 kJ/mol for thin film). Viscosity of Ge18Sb28Se54 material was measured in the region of the undercooled melt and glass. The extrapolation of viscosity data into the immeasurable, but important, temperature range is discussed. The experimental growth data were combined with melting and viscosity data and the appropriate growth models were proposed to describe crystal growth in a wide temperature region. The standard crystal growth models are based on a simple proportionality of the crystal growth rate to the viscosity (u proportional to eta(-1)). This simple proportionality holds for the bulk material. Nevertheless, in the thin films the decoupling of the crystal growth rate from the inverse viscosity occurs, and the standard kinetic growth models need to be corrected. Such corrections provide better description of experimental data and more realistic value of the parameter describing the mean interatomic distance in the crystal-liquid interface layer, where the crystal growth takes place.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10403 - Physical chemistry
Návaznosti výsledku
Projekt
<a href="/cs/project/GA16-10562S" target="_blank" >GA16-10562S: Viskozita a kinetické jevy ve sklotvorných systémech</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2017
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Physical Chemistry B
ISSN
1520-6106
e-ISSN
—
Svazek periodika
121
Číslo periodika v rámci svazku
33
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
9
Strana od-do
7978-7986
Kód UT WoS článku
000408598300025
EID výsledku v databázi Scopus
2-s2.0-85028305046